Scanning electron microscopy
Our two modern universal scanning electron microscopes enable us to carry out examinations at the highest technical level. High-resolution analysis procedures with SE, BSE and ESED detectors and the possibility to carry out energy-dispersive x-ray spectroscopy (EDX) make it possible to pick up on the tiniest flaws and deviations in materials.
The scanning electron microscopy is a key procedure in the damage analysis. The examination of fracture surfaces with the scanning electron microscope enables to obtain conclusions about the fracture mechanism which has caused the failure. The evaluation of highly stressed component surfaces, e.g. rolling bearing running surfaces, under the scanning electron microscope provides important information about the operating states occurring during use and the degree of damage to the surfaces.